The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jul. 22, 2014
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Kunal Kapur, San Carlos, CA (US);

Chi Cheong C. Chan, Daly City, CA (US);

Constantinos Papadopoulos, Nicosia, CY;

Qiwen Jiang, Shanghai, CN;

Qian Li, Shanghai, CN;

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/0639 (2013.01); H04L 43/0823 (2013.01);
Abstract

Systems, methods, and other embodiments associated with monitoring business transactions are described. In one embodiment, a computer-implemented method comprises tracking calls made from a first component to other components in a distributed application wherein the calls are part of processing a business transaction. Aggregate metrics are collected and instance metrics are collected for each of the calls made and a time spent for processing the calls. The method identifies and selects N calls that consumed the most time based on the time spent for processing each call. The instance metrics for the selected N calls and the aggregate metrics are reported to a monitoring server, while the instance metrics from unselected calls are discarded.


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