The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Sep. 27, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Daniel P. Craggs, Montreal, CA;

Jeremiah S. Swan, Stouffville, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3624 (2013.01); G06F 11/3664 (2013.01);
Abstract

A method for automatic debug session analysis for related work item discovery, is provided. The method includes recording metadata describing a particular debug session associated with a user for a respective work item. The method further includes associating the metadata recorded in the particular debug session with the respective work item. In response to the user working on a new issue, comparing the metadata saved with other work items. In response to identifying a work item with a predetermined level of similar metadata from debug sessions, notifying the user of a potential work item match. In response to not identifying a work item with a predetermined level of similar metadata from debug sessions, refraining from suggesting the new issue for future matches.


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