The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Mar. 27, 2015
Applicant:

Ca, Inc., New York, NY (US);

Inventors:

Francois Cattoen, Paris, FR;

Janne Koponen, Datchet, GB;

Dhesikan Ananchaperumal, Framingham, MA (US);

Assignee:

CA, INC., New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/32 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3058 (2013.01); G06F 11/3062 (2013.01); G06F 11/3065 (2013.01); G06F 11/32 (2013.01);
Abstract

A method for monitoring environmental parameters associated with computer equipment is described. According to the method a number of environmental parameters related to a number of computing devices are measured using a number of sensors associated with, and located at, a number of computing devices. The sensed environmental parameters are displayed, with a computer, based on an actual view of the number of computing devices. The displayed sensed environmental parameters create a spatial relation with a space to which each sensed environmental parameter pertains.


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