The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Sep. 26, 2016
Applicant:

Tactual Labs Co., New York, NY (US);

Inventors:

Jonathan Deber, Toronto, CA;

Bruno Rodrigues De Araujo, Toronto, CA;

Ricardo Jorge Jota Costa, Toronto, CA;

Clifton Forlines, South Portland, ME (US);

Darren Leigh, Round Hill, VA (US);

Steven Leonard Sanders, New York, NY (US);

Daniel Wigdor, Toronto, CA;

Assignee:

Tactual Labs Co., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/66 (2006.01); G06F 11/30 (2006.01); G06F 3/044 (2006.01); G06F 3/041 (2006.01); G06F 11/34 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3041 (2013.01); G06F 3/044 (2013.01); G06F 3/0418 (2013.01); G06F 11/2221 (2013.01); G06F 11/3419 (2013.01);
Abstract

In an embodiment, a latency measuring head is provided for use in measuring touch-to-response latency in a test device, the test device including a capacitive user interface that responds to touch input. The latency measuring head includes a conductive element adapted to be positioned in static proximity with and/or in contact with the capacitive user interface. An electron sink is operatively connected to the conductive element via a normally open switch having an open and a closed position. The electron sink has capacity to hold or dissipate a sufficient charge to trigger a touch event on the test device when the switch is closed. A photosensitive element is positioned in static proximity with and/or in contact with the capacitive user interface such that the photosensitive element can output a signal in response to a change in an optical property of at least a portion of the capacitive user interface. Software for performing analysis of latency measurements from a latency measuring device and generating statistics that summarize latency performance of a test device is further disclosed.


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