The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jun. 22, 2015
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Teruaki Sakata, Tokyo, JP;

Tsutomu Yamada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/08 (2006.01); H03K 19/173 (2006.01); G01R 31/3185 (2006.01); H03K 19/177 (2006.01); B61L 5/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/085 (2013.01); G01R 31/318519 (2013.01); H03K 19/173 (2013.01); H03K 19/1776 (2013.01); H03K 19/17728 (2013.01); H03K 19/17744 (2013.01); H03K 19/17776 (2013.01); B61L 5/18 (2013.01);
Abstract

An object of the invention is to provide a field programmable gate array which is able to prevent an inappropriate value from being output to the outside of an FPGA even when an SRAM-based programmable logic portion is out of order and to secure safety of a system. The field programmable gate array of the invention includes a hard macro CPU in which a circuit structure is fixed, a programmable logic in which a circuit structure is changeable, a diagnosis circuit which diagnoses an abnormality of the programmable logic, and a fail-safe interface circuit which is able to control an external output from the programmable logic to a safe side, and the hard macro CPU outputs a fail-safe signal which is an output of a safe side to the fail-sate interface circuit when an error is detected by the diagnosis circuit.


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