The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Sep. 02, 2016
Amazon Technologies, Inc., Seattle, WA (US);
Mathias G. Ricken, Bremen, GR;
Arthur Carré, Seattle, WA (US);
Miles C. Kaufmann, Seattle, WA (US);
Aaron T. Olds, Seattle, WA (US);
Muhammad Ali Siddiqui, Snoqualmie, WA (US);
Sanjeev K. Verma, Seattle, WA (US);
Kendra A. Yourtee, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Systems and methods are provided for analyzing operating metrics of monitored metric sources. Aspects of the present disclosure may present for display information associated with the monitored metric source and the analysis of its operating metrics. Analysis comprises determination of reference values and tolerance levels which represent allowable deviations from the reference values. Input data includes a measurement of an operating parameter and a time stamp. Input data may be saved to a data store for using in future analysis of other input data. When input data is determined to be outside the tolerance level, notifications may be issued to alert administrators or systems of the anomaly.