The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Jan. 12, 2016
Fanuc Corporation, Yamanashi, JP;
Hajime Ogawa, Yamanashi, JP;
Junichi Tezuka, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An automatic parameter adjustment device capable of quantitatively determine the degree of importance of a processing time and a processing accuracy, and effectively adjusting a parameter in accordance with a processing condition. The adjustment device includes: a parameter changing part which changes a control parameter; a test program executing part which transmits a test program to a numerical controller for executing the test program; an execution result obtaining part which obtains an execution result of the test program; a storing part which stores the execution result and the parameter corresponding thereto; a weighting part which determines weighting coefficients of the processing time and processing accuracy as evaluation criteria based on input or setting by an operator; and a parameter extracting part which evaluates the execution result based on the weighted evaluation criteria, and extracts an optimum parameter from the storing part based on the evaluated execution result.