The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Jul. 25, 2017
Icoat Company, Llc, Santa Fe Springs, CA (US);
Wiley X, Inc., Livermore, CA (US);
Thomas Pfeiffer, Santa Fe Springs, CA (US);
Michael Bumerts, Livermore, CA (US);
Lawrence Wickline, Santa Fe Springs, CA;
Imtiaz Hasan, Santa Fe Springs, CA (US);
Timothy George Stephan, Huntington Beach, CA (US);
Dan Freeman, Livermore, CA (US);
Arman Bernardi, Glendale, CA (US);
iCoat Company, LLC, Santa Fe Springs, CA (US);
Wiley X, Inc., Livermore, CA (US);
Abstract
Systems, methods and devices for measuring eyewear characteristics are provided. The eyewear measurement systems and devices comprise a plurality of measurement standard frames, each having lenses marked with visible gridlines specifically configured to the measurement standard frame to allow for the direct measurement of a PD and SH/FH with respect to each eye of the wearer.