The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jun. 13, 2014
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventor:

Fabien Muradore, Charenton le Pont, FR;

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 5/00 (2006.01); G02C 7/02 (2006.01); G02C 13/00 (2006.01); G02C 7/06 (2006.01);
U.S. Cl.
CPC ...
G02C 7/028 (2013.01); G02C 7/024 (2013.01); G02C 7/027 (2013.01); G02C 7/066 (2013.01); G02C 13/003 (2013.01); G02C 13/005 (2013.01);
Abstract

Method implemented by computer means for optimizing a measured contour of an opening of a spectacle frame, the method comprising: a contour data providing step, a working contour defining step, during which a working contour of the spectacle frame is defined, a first contour cost function providing step, during which a first contour cost function function of the mth derivative of the curve of the contour is provided, a set of contour cost functions providing step, during which a set of contour cost functions is provided, a global contour cost function evaluation step during which a global contour cost function is evaluated, a contour modifying step, during which the working contour is modified, wherein the global contour cost function evaluation and contour modifying steps are repeated so as to minimize the global contour cost function.


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