The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Apr. 29, 2016
Applicant:
Sure Optics, Inc., Cambridge, MA (US);
Inventors:
Frederick J. Leonberger, Sarasota, FL (US);
Jeffrey Farmer, Chelmsford, MA (US);
Zong-Long Liau, Belmont, MA (US);
Assignee:
Sure Optics, Inc., Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 27/58 (2006.01); G02B 21/16 (2006.01); G02B 21/34 (2006.01); G01N 21/03 (2006.01); B01L 3/00 (2006.01); G02B 3/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 27/58 (2013.01); B01L 3/5085 (2013.01); G01N 21/0303 (2013.01); G01N 21/6452 (2013.01); G02B 3/0056 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/34 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0822 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6478 (2013.01); G01N 2021/6482 (2013.01);
Abstract
An optical imaging system with microlens array with integral structure includes a microlens array having a back surface for depositing sample material to be imaged and one or more microlenses on a front surface. At least one of the one or more microlenses are aligned to the deposited sample material. A plate is attached to the microlens array. A microscope objective is positioned proximate to the plurality of microlenses.