The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jul. 02, 2014
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Joaquikn L. Herraiz, Boston, MA (US);

Eduardo M. Lage, Boston, MA (US);

Vicente J. Parot, Cambridge, MA (US);

Shivang R. Dave, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/164 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/1647 (2013.01); A61B 6/037 (2013.01); A61B 6/4216 (2013.01); A61B 6/4266 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); A61B 6/5282 (2013.01);
Abstract

A method and system for acquiring a series of medical images includes a plurality of detectors configured to be arranged to acquire gamma rays emitted from a subject as a result of an advanced radionuclide administered to the subject and communicate signals corresponding to acquired gamma rays. A data processing system is configured to receive the signals from the plurality of detectors, determine double coincidence event dataset and a multiple coincidence event dataset, separate the multiple coincidence event dataset into at least one of a standard lines of response dataset and a nonstandard lines of response dataset, and apply a background correction to the double coincidence event dataset based on the non-standard lines of response dataset and/or the standard lines of response dataset to obtain a standard coincidence dataset.


Find Patent Forward Citations

Herraiz, Joaquikn. (2019). System and method to improve image quality of emission tomography when using advanced radionuclides (U.S. Patent No. 10215864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10215864

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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