The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Sep. 20, 2018
Beihang University, Beijing, CN;
BEIHANG UNIVERSITY, Beijing, CN;
Abstract
A Beidou ground-based augmentation system integrity risk monitoring system includes a ground side and an on-board side. A processor of the on-board side receives a ground side monitoring statistical magnitude and an on-board side monitoring statistical magnitude to establish a threshold model, which is established by: recognizing a satellite number and inputting overall data on the monitoring statistical magnitude within one period of satellite; uniformly converting the inputted overall data from an initial equidistant measurement to an equal-ratio measurement; calculating a correlation coefficient between the two monitoring statistical magnitudes to determine a degree of freedom and a weight coefficient required for hypothesis testing; calculating an observed value of a Chi-square test statistical magnitude; deciding whether the observed value is within a rejection region; calculating a risk ratio and a reliability value; and obtaining the threshold model by utilizing an inverse transformation for converting a unified measurement.