The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

May. 24, 2017
Applicant:

Chroma Ate Inc., Taoyuan, TW;

Inventors:

Peng-Fei Chen, Taoyuan, TW;

Mao-Sheng Liu, Taoyuan, TW;

Assignee:

CHROMA ATE INC., Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/36 (2006.01); G01R 1/067 (2006.01); G01R 1/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3644 (2013.01); G01R 1/02 (2013.01); G01R 1/067 (2013.01); G01R 1/06788 (2013.01);
Abstract

A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.


Find Patent Forward Citations

Loading…