The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Jan. 20, 2017
Megachips Corporation, Osaka, JP;
Hiroyuki Nakamura, Chiba, JP;
MegaChips Corporation, Osaka, JP;
Abstract
A scan test circuit includes a scan chain formed of a plurality of sub-scan chains, an input distribution circuit, and an output compression circuit. With the use of a bypass circuit, a plurality of sub-scan chains are formed in a compression scan mode by connecting scan cell circuits of a high confidentiality-requiring circuit among a plurality of scan cell circuits included in an internal circuit, and a plurality of sub-scan chains are formed in a non-compression scan mode by bypassing the scan cell circuits of the high confidentiality-requiring circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile