The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

May. 21, 2013
Applicant:

Endress + Hauser Gmbh + Co. KG, Maulburg, DE;

Inventors:

Stefan Gorenflo, Hausen, DE;

Alexey Malinovskiy, Maulburg, DE;

Klaus Pankratz, Kandern, DE;

Assignee:

ENDRESS+HAUSER SE+CO.KG, Maulburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/00 (2006.01); G01F 23/28 (2006.01); G01F 23/284 (2006.01); G01F 23/296 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01F 23/0061 (2013.01); G01F 23/0069 (2013.01); G01F 23/2962 (2013.01);
Abstract

A method for measuring fill level of a fill substance. Transmission signals are sent and their fractions reflected on reflectors in the container and received as received signals. Based on the received, echo functions are derived and wanted echos of predetermined wanted echo types respectively contained in the echo functions and identifiable based on predetermined echo recognition methods are ascertained. Each wanted echo is a local maximum and is attributable to a reflection on a reflector associated with its wanted echo type. Echo quality of each wanted echo is determined. The echo quality is higher, the more peak shaped the echo function is in the region of the respective wanted echo, and the fill level is determined taking into consideration echo qualities of the wanted echos.


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