The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Dec. 29, 2016
Applicant:

Noporvis Co., Ltd., Kaohsiung, TW;

Inventors:

Wei-Hung Su, Kaohsiung, TW;

Hui-Hung Lin, Tainan, TW;

Kuo-Kai Hung, Tainan, TW;

Chun-Neng Chan, Kaohsiung, TW;

Lu-Yu Wang, Tainan, TW;

Assignee:

NOPORVIS CO., LTD., Kaohsiung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01); G01B 9/02 (2006.01); B23Q 17/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/26 (2013.01); B23Q 17/2428 (2013.01); G01B 9/02019 (2013.01); G01B 9/02027 (2013.01); G01B 2290/70 (2013.01);
Abstract

A rotation angle measuring device includes a light source for generating a first light beam with a first polarization direction and a second light beam with a second polarization direction; a first beam splitter for splitting the first light beam and the second light beam to generate a third light beam and a fourth light beam; an image sensor for sensing a first interference pattern generated by the first and second light beams passing through a first displacement measurement module, and sensing a second interference pattern generated by the third and fourth light beams passing through a second displacement measurement module; and a processing unit for calculating two displacement values at two different positions on a measured object according to the first and second interference patterns, in order to further calculate a rotation angle of the rotation angle measuring device relative to the measured object along a first axis.


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