The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Nov. 21, 2013
Takahiro Mamiya, Aichi, JP;
Takahiro Mamiya, Aichi, JP;
CKD Corporation, Aichi, JP;
Abstract
A three-dimensional measuring apparatus includes a first irradiating unit, a second irradiating unit, imaging unit that can image a measured object, a first image data acquiring unit that acquires a plurality of image data imaged by the imaging unit under the light pattern irradiated from the first irradiating unit for each predetermined amount of conveyance by the measured object, a three-dimensional measuring unit that three dimensionally measures based on a plurality of image data acquired by the first image data acquiring unit, and a second image data acquiring unit that acquires image data imaged by the imaging unit under the second light irradiated from the second irradiating unit between after predetermined image data from among the plurality of image data acquired by the first image data acquiring unit is imaged and until the next image data is imaged.