The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Aug. 10, 2017
Apple Inc., Cupertino, CA (US);
Denis G. Chen, San Jose, CA (US);
Jui Hua Liu, Cupertino, CA (US);
Xingxing Cai, Santa Clara, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Systems and techniques are described for measuring displacement of a mass by using an array of beams for scanning a binary intensity pattern disposed on a surface of the mass. Further, systems and techniques are described for measuring displacement of a moving mass by combining (i) information obtained from scanning, using a beam of light, an intensity pattern disposed on a surface of the mass, with (ii) information obtained when a coil interacts with a magnet attached to the moving mass. Furthermore, systems and techniques are described for measuring displacement of a mass by illuminating an intensity pattern disposed on a surface of the mass with an array of beams and monitoring intensity of each of the beams that is redirected by the intensity pattern.