The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jun. 30, 2015
Applicant:

Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno, 's-Gravenhage, NL;

Inventors:

Robert Snel, 's-Gravenhage, NL;

Wouter Andries Jonker, 's-Gravenhage, NL;

Thomas Liebig, 's-Gravenhage, NL;

Jasper Winters, 's-Gravenhage, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); A61B 5/0066 (2013.01); G01B 9/0201 (2013.01); G01B 9/02071 (2013.01); G01B 2290/60 (2013.01);
Abstract

An optical coherence tomography microscopy apparatus () is presented for detecting a three-dimensional image of an optically translucent or reflective sample object (OS), the apparatus comprising an interferometric optical setup including a photo sensor unit (). A sense signal Si from the photo sensor unit () is detected using a detection reference signal. The detection reference signal is derived from a signal indicative for a relative displacement of the sample object (OS) with respect to a reference object.


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