The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Feb. 17, 2017
Applicant:

The United States of America As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Matthew Thurner, Bloomfield, IN (US);

Brandon Clarke, Bloomington, IN (US);

Ronald A Volpone, Dayton, OH (US);

David Scot Curry, Bloomington, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F41G 1/54 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
F41G 1/54 (2013.01); G01M 99/002 (2013.01);
Abstract

Exemplary testing systems and methods are provided including a system configured to test for thermal drift of a unit under test (UUT) under various temperature or environmental conditions and generating an output including visual or data on the thermal drift, if any. The methods involve attaching a UUT to a mounting device within a thermally controlled chamber, collimating light received from a UUT, recording the resulting images, and comparing the results at different temperatures to determine how much thermal drift has occurred. In addition, there are testing apparatuses capable of performing the tests.


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