The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2019

Filed:

Jun. 04, 2014
Applicant:

Element Six Technologies Limited, Didcot, Oxfordshire, GB;

Inventors:
Assignee:

Element Six Technologies Limited, Didcot, Oxfordshire, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/16 (2006.01); C30B 29/04 (2006.01); C30B 33/00 (2006.01); C30B 33/04 (2006.01); C30B 33/08 (2006.01); B24B 49/10 (2006.01); B26D 5/00 (2006.01);
U.S. Cl.
CPC ...
C30B 25/16 (2013.01); B24B 49/10 (2013.01); B26D 5/007 (2013.01); C30B 29/04 (2013.01); C30B 33/00 (2013.01); C30B 33/04 (2013.01); C30B 33/08 (2013.01);
Abstract

A method of processing a super-hard material having a Vickers hardness of no less than 2000 kg/mm2, the method comprising: (a) forming a surface of the super-hard material to have a first surface profile within a first root mean square deviation being no more than 5 μm; (b) analyzing said surface of the super-hard material to detect a plurality of protruding regions on said surface; and (c) selectively processing over only the protruding regions on the surface of the super-hard material to form a second surface profile within a second root mean square deviation from the smooth target surface profile, said second root mean square deviation being no more than 100 nm.


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