The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
Sep. 12, 2016
Applicant:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Inventors:
Atsuko Iida, Yokohama, JP;
Norihiro Yoshinaga, Kawasaki, JP;
Shigeru Matake, Yokohama, JP;
Wu Mei, Yokohama, JP;
Assignee:
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
C25B 11/00 (2006.01); C25B 11/04 (2006.01); C25B 1/10 (2006.01); C23C 14/00 (2006.01); C23C 14/08 (2006.01); C23C 14/58 (2006.01);
U.S. Cl.
CPC ...
C25B 11/0447 (2013.01); C23C 14/0036 (2013.01); C23C 14/083 (2013.01); C23C 14/5806 (2013.01); C25B 1/10 (2013.01); C25B 11/0415 (2013.01); C25B 11/0478 (2013.01); C25B 11/0484 (2013.01); Y02E 60/366 (2013.01);
Abstract
An electrode of an embodiment includes a base material, and a catalyst layer provided on the base material and having a porous structure. When a sum of heights of all peaks belonging to Ir oxide is I0, the height of a peak of IrO(110) is I1, and the height of a peak of IrO(211) is I2, a ratio of (I1+I2)/I0, which is a ratio of spectra obtained by X-ray diffraction measurements using Kα rays of Cu in the catalyst layer, is 50% or more and 100% or less in a range of a diffraction angle of 20 degrees or more and 70 degrees or less.