The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Sep. 24, 2015
Koninklijke Philips N.v., Eindhoven, NL;
Christiaan Varekamp, Eindhoven, NL;
Patrick Luc Els Vandewalle, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
An apparatus for reducing the visibility of disparity estimation errors at edges, and in particular at overlays. The apparatus comprises a receiver () for receiving a three dimensional image represented by at least image values (brightness/contrast values) and a disparity value. A subset selector () evaluates an image property criterion for the image value for a group of pixels and determines a subset of pixels of the group of pixels for which the image property criterion is met. The criterion may for example reflect whether the pixel belongs to an image object edge. A distribution evaluator () generates a frequency distribution for disparity values of the subset of pixels and an analyzer () determines a shape property for the frequency distribution (the presence of a peak). An adaptor () determining a disparity remapping in response to the shape property and a remapper () modifies disparity values of the three dimensional image by applying the disparity remapping. The approach may e.g. reduce image depth when overlay graphics is likely to be present.