The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Dec. 29, 2014
Lg Cns Co., Ltd., Seoul, KR;
Seung Kab Rho, Seoul, KR;
LG CNS CO., LTD., Seoul, KR;
Abstract
Provided is a performance testing method, a system and a storage medium for the same. The method may include determining test object metadata that defines a protocol for a test object and test job metadata that defines a performance test using a prescribed job, generating job data based on the test job metadata, generating load data according to the prescribed job to provide the load data to at least one test performing node among a plurality of test performing nodes coupled to the test object, and causing the at least one test performing node to perform the performance test for the test object.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile