The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Sep. 04, 2017
Applicant:

Toshiba Memory Corporation, Tokyo, JP;

Inventors:

Masaya Shima, Yokkaichi Mie, JP;

Eiji Takano, Nagoya Aichi, JP;

Ippei Kume, Yokkaichi Mie, JP;

Yuki Noda, Yokkaichi Mie, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/56 (2006.01); H01L 23/532 (2006.01); H01L 25/00 (2006.01); H01L 23/00 (2006.01); H01L 21/78 (2006.01); H01L 25/065 (2006.01); H01L 23/48 (2006.01); H01L 23/31 (2006.01); H01L 23/40 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 23/562 (2013.01); H01L 21/67092 (2013.01); H01L 21/76898 (2013.01); H01L 21/78 (2013.01); H01L 23/3171 (2013.01); H01L 23/4012 (2013.01); H01L 23/481 (2013.01); H01L 24/11 (2013.01); H01L 24/13 (2013.01); H01L 25/0657 (2013.01); H01L 25/50 (2013.01); H01L 2224/1146 (2013.01); H01L 2224/13025 (2013.01); H01L 2224/13147 (2013.01); H01L 2225/06544 (2013.01); H01L 2225/06586 (2013.01);
Abstract

A method of manufacturing a semiconductor device includes stacking a first substrate comprising a first surface having a semiconductor element and an opposing second surface and a second substrate comprising a third surface having a semiconductor element and an opposing fourth surface, forming a first contact hole extending from the second surface to the first surface of the first substrate and forming a first groove inwardly of a first region of the second surface of the first substrate by etching inwardly of the first substrate from the second surface thereof, forming a first patterned mask on the first substrate, so that the first groove is covered by the material of the first patterned mask, forming a first metal electrode in the first contact hole through an opening in the first mask as a mask, and removing the first mask and subsequently cutting through the first substrate in the first groove.


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