The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Aug. 01, 2017
The Chinese University of Hong Kong, Hong Kong, CN;
Shih-Chi Chen, Hong Kong, CN;
Yina Chang, Hong Kong, CN;
Chenyang Wen, Hong Kong, CN;
Chenglin Gu, Hong Kong, CN;
The Chinese University of Hong Kong, Hong Kong, CN;
Abstract
Methods and systems for axial-scanning a sample. The method may include generating a scanning beam along a transverse scanning direction across the sample; acquiring radial positions of the generated scanning beam along the transverse scanning direction; and determining, based on the radial positions of the generated scanning beam and desired focal lengths, a phase mask so that the scanning beam at different radial positions along the scanning direction is focused to different axial positions of the sample along an optical axis transverse to the scanning direction.