The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Mar. 26, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gal Ashour, Yoqneam, IL;

Dror Porat, Haifa, IL;

Daniel N Rotman, Karmiel, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/93 (2006.01); G11B 27/00 (2006.01); G11B 27/34 (2006.01); G06K 9/00 (2006.01); G11B 27/031 (2006.01);
U.S. Cl.
CPC ...
G11B 27/34 (2013.01); G06K 9/00765 (2013.01); G11B 27/031 (2013.01);
Abstract

Segmenting serial data by processing multiple candidate segmentation point sets associated with a serial data set, each candidate set including a different number of candidate segmentation points representing the serial data set as segments in accordance with segmentation criteria, where the processing includes determining, for each of the candidate points, a count of the candidate sets that include the candidate point, and creating, for each of the candidate sets, a corresponding alternative segmentation point set associated with the serial data set, where the alternative set includes n alternative segmentation points representing the serial data set as n+1 segments, where n equals the number of candidate points in the candidate set to which the alternative set corresponds, and where the n alternative points in the alternative set correspond to n of the candidate points having the greatest counts, and arranging the alternative sets in order of their numbers of segmentation points.


Find Patent Forward Citations

Loading…