The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

May. 21, 2018
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Antonia Tsoukatos, Maple Grove, MN (US);

Tim Rausch, Farmington, MN (US);

Mehmet Fatih Erden, St. Louis Park, MN (US);

Benjamin W Parish, Prior Lake, MN (US);

Prasanna Manja Ramakrishna, Aurora, CO (US);

John D Reinhardt, Berthoud, CO (US);

Morovat Bryan Tayefeh, Longmont, CO (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 20/18 (2006.01); G11B 5/596 (2006.01); G11B 20/12 (2006.01); G11B 5/455 (2006.01);
U.S. Cl.
CPC ...
G11B 20/182 (2013.01); G11B 5/455 (2013.01); G11B 5/59666 (2013.01); G11B 20/1217 (2013.01); G11B 2020/1826 (2013.01);
Abstract

A method for scanning for flaws on a magnetic recording medium is disclosed. The magnetic recording medium has a first set of nonconsecutive data tracks and a second set of nonconsecutive data tracks. The method includes writing a test pattern to only the first set of nonconsecutive data tracks of the magnetic recording medium, reading of the test pattern written to the first set of nonconsecutive data tracks, and identifying flaws within the first set of nonconsecutive data tracks and the second set of nonconsecutive data tracks based on the reading the test pattern.


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