The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Jun. 06, 2016
Applicant:
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Inventors:
Keisuke Yamakawa, Tokyo, JP;
Shinichi Kojima, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); A61B 6/032 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); G06T 5/002 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/424 (2013.01);
Abstract
High-quality image and low radiation exposure are achieved without increasing man-hours and data amount to be held. A table of iterative correction parameters optimized in the representative imaging conditions is held and an iterative correction parameter optimized in the actual imaging conditions is determined from the iterative correction parameters held in the table. In addition to the parameter table, a reference weight is also held and is reflected to generate the iterative correction parameter for each pixel position.