The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Jul. 31, 2014
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, JP;

Inventors:

Yukiyasu Domae, Chiyoda-ku, JP;

Makito Seki, Chiyoda-ku, JP;

Shintaro Watanabe, Chiyoda-ku, JP;

Satoru Sofuku, Chiyoda-ku, JP;

Yutaka Ezaki, Chiyoda-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/70 (2017.01); G01B 11/00 (2006.01); G06K 9/46 (2006.01); H04N 5/907 (2006.01); H04N 7/18 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G01B 11/002 (2013.01); G06K 9/4604 (2013.01); G06T 7/74 (2017.01); H04N 5/907 (2013.01); H04N 7/183 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A storage device stores capturing conditions including a viewpoint position and a shooting direction of the camera, model data including a shape of a segmented mirror, and feature point data representing a positional relationship among a viewpoint position and feature points. A camera captures the segmented mirror having a reflective surface to obtain a captured image including at least a part of the reflective surface. A marker object has feature points, and is fixed at a predetermined position with respect to the camera. A feature-point extracting unit extracts multiple feature points from a captured image in which the feature points are reflected in the reflective surface, and determines positions of the feature points within the captured image. A position measuring unit calculates a position of the segmented mirror, based on the capturing conditions, the model data, the feature point data, and the positions of the feature points within the captured image.


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