The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Jan. 23, 2017
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Ilia Vitsnudel, Mountain View, CA (US);

Ilya Vladimirovich Brailovskiy, Even Yehuda, IL;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06K 9/4628 (2013.01); G06K 9/66 (2013.01); G06N 3/08 (2013.01); G06T 2207/20024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30196 (2013.01);
Abstract

A computer system determines a metric for an input object, which could be an image of a person with the metric being measure of the person's body size, age, etc. A paired neural network system is trained on a training set of objects having pairs of objects each assigned a relative metric. A relative metric for a pair indicate which of the pair has the higher metric. A representative set of objects includes a known assigned metric value for each object. The trained paired neural network system pairwise compares an input object with objects from the representative set to determine a relative metric for each such pair, to arrive at a collection of relative metrics of the input object relative to various objects in the representative set. A metric value can be estimated for the input object based on the collection of relative metrics and those known metric values.


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