The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Apr. 14, 2017
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Stuart Schweid, Pittsford, NY (US);

Douglas R. Taylor, Webster, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06K 9/62 (2013.01); G06K 9/6202 (2013.01); G06K 9/6267 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/20036 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An image system for detecting defects in an image may include a processing device to detect defects in a target image by analyzing the activity level in a reference and the target image. The system may identify a quiet area/pixel in the reference image based on the activity level, check the activity level of the corresponding pixel in the target image, and classify the pixel in the target image as defective if the activity level of the pixel in the target image exceeds a noise threshold. The system may additionally swap the reference and target image, repeat the detection steps and combine the detection results with those before the swap. The system may also include an image sensor to scan a printed document of the reference image into a scanned electronic document (the target image).


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