The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Aug. 19, 2010
Applicants:

Uan Sharon Kang, Westford, MA (US);

Susan Golob, Bedford, MA (US);

Sheila Brigid Filteau, Methuen, MA (US);

Inventors:

Uan Sharon Kang, Westford, MA (US);

Susan Golob, Bedford, MA (US);

Sheila Brigid Filteau, Methuen, MA (US);

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/24 (2012.01); G06F 15/00 (2006.01); G16H 30/40 (2018.01); G16H 30/00 (2018.01); G16H 30/20 (2018.01); G16H 10/60 (2018.01); G16H 15/00 (2018.01);
U.S. Cl.
CPC ...
G06Q 50/24 (2013.01); G16H 10/60 (2018.01); G16H 15/00 (2018.01); G16H 30/00 (2018.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01);
Abstract

A system and method for mapping standard measurements to local measurements. The system and measurements reading a structured report information object, matching the standard measurements from the structured report information object to corresponding existing local measurements from a local measurement database and generating a summary page including the matched standard measurements and the corresponding existing local measurements and further including unmatched standard measurements that do not correspond to local measurements.


Find Patent Forward Citations

Kang, Uan. (2019). Generic method of handling dicom structured reporting contents (U.S. Patent No. 10210589). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10210589

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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