The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Mar. 21, 2014
International Business Machines Corporation, Armonk, NY (US);
Alain Biem, Yorktown Heights, NY (US);
Nagui Halim, Yorktown Heights, NY (US);
Srinivasan Parthasarathy, Yorktown Heights, NY (US);
Daby M. Sow, Yorktown Heights, NY (US);
Deepak S. Turaga, Yorktown Heights, NY (US);
Long H. Vu, Yorktown Heights, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for performing assisted knowledge discovery includes receiving a dataset. Each of a plurality of analytical techniques is applied to the received data set to generate a plurality of corresponding analytical results. A composite validation metric is applied to each of the plurality of analytical results. The composite validation metric is a single scoring/ranking function that is created from a plurality of different scoring/ranking functions. The plurality of analytical results is presented to a user arranged in accordance with the results of the applying the composite validation metric to each of the plurality of analytical results. A selection from the user from among the plurality of analytical results is recorded. The user's selection is used to modify the composite validation metric such that the analytical techniques responsible for generating the selected analytical result is scored/ranked more highly.