The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Sep. 07, 2017
Ningbo University, Ningbo, Zhejiang, CN;
Ningbo University, Ningbo, Zhejiang, CN;
Abstract
A method for evaluating quality of tone-mapping image based on exposure analysis is provided, which explores the exposure properties on each area of the high dynamic range image utilizing the pre-exposure method and divides the high dynamic range image into three parts of an easy overexposed area, an easy underexposed area and an easy natural-exposed area, wherein different quality characteristics are extracted in different areas, which is capable of ensuring that the follow-up quality characteristic extraction is more targeted. The present invention takes the difference of distortion between the tone-mapping image and the conventional image into account, and extracts image characteristics such as the abnormal exposure rate, the underexposed residual energy, the overexposed residual energy and the exposure color index, so as to accurately reflect the quality degradation of the tone-mapping image.