The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Jun. 12, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Hidetaka Ohira, Kanagawa, JP;

Masahiro Sekine, Tokyo, JP;

Masashi Nishiyama, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/3241 (2013.01); G06K 9/00671 (2013.01); G06K 9/3275 (2013.01);
Abstract

According to an embodiment, an object detection system includes an obtaining unit, an estimating unit, a setting unit, a calculating unit, and a detecting unit. The obtaining unit is configured to obtain an image in which an object is captured. The estimating unit is configured to estimate a condition of the object. The setting unit is configured to set, in the image, a plurality of areas that have at least one of a relative positional relationship altered according to the condition and a shape altered according to the condition. The calculating unit is configured to calculate a feature value of an image covering the areas. The detecting unit is configured to compare the calculated feature value with a feature value of a predetermined registered object, and detect the registered object corresponding to the object.


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