The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Feb. 19, 2008
Applicants:
Sven Hedlund, Genarp, SE;
Oscar Beijbom, Lund, SE;
Martin Almers, Lund, SE;
Inventors:
Assignee:
CellaVision AB, Lund, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/00 (2006.01); G03B 13/32 (2006.01); G06T 7/11 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00134 (2013.01); G03B 13/32 (2013.01); G06T 7/11 (2017.01); G06T 7/90 (2017.01); G06T 2207/30024 (2013.01);
Abstract
In one embodiment of the present invention, a method is disclosed for determining a difference between a sample position and an in-focus position, as well as a vision inspection system. In a first step image data depicting a sample is captured. Next, a feature set is extracted from the image data. Thereafter, the feature set is classified into a position difference value, corresponding to the difference between the sample position and the in-focus position, by using a machine learning algorithm that is trained to associate image data features to a position difference value.