The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Feb. 28, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Manish Anand, Irving, TX (US);

Pathan Niyazulla Khan, Bangalore, IN;

Sweta Singh, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30306 (2013.01); G06F 17/30404 (2013.01);
Abstract

A method for analyzing performance of a computer system where at a plurality of time intervals, a set of KPIs of a database and database performance outputs are monitored. A database performance value is calculated based on the monitored KPIs and one or more database performance outputs. In response to determining the database performance value is below a first threshold, a KPI correlation coefficient is calculated. The calculated KPI correlation coefficient with the greatest value is selected as a target KPI. In response to determining that a count of functions of the target KPI meets a second threshold, a dynamic tabular representation of the determined target KPI is generated. A correlation matrix is generated based on the generated tabular representation and the plurality of time intervals and a first set of target functions are identified based on the generated correlation matrix.


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