The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Apr. 28, 2017
Netapp, Inc., Sunnyvale, CA (US);
Dhaval Patel, Sunnyvale, CA (US);
Manish Swaminathan, Fremont, CA (US);
Edward D. McClanahan, Danville, CA (US);
John Muth, Scotts Valley, CA (US);
NetApp, Inc., Sunnyvale, CA (US);
Abstract
A rate matching technique may be configured to adjust a rate of cleaning of one or more selected segments of the storage array to accommodate a variable rate of incoming workload processed by a storage input/output (I/O) stack executing on one or more nodes of a cluster. An extent store layer of the storage I/O stack may clean a segment in accordance with segment cleaning which, illustratively, may be embodied as a segment cleaning process. The rate matching technique may be implemented as a feedback control mechanism configured to adjust the segment cleaning process based on the incoming workload. Components of the feedback control mechanism may include one or more weight schedulers and various accounting data structures, e.g., counters, configured to track the progress of segment cleaning and free space usage. The counters may also be used to balance the rates of segment cleaning and incoming I/O workload, which may change depending upon an incoming I/O rate. When the incoming I/O rate changes, the rate of segment cleaning may be adjusted accordingly to ensure that rates are substantially balanced.