The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Apr. 27, 2017
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Jian Gao, Beijing, CN;

Lili Chen, Hopkinton, MA (US);

Qingyun Liu, Beijing, CN;

Ree Sun, Beijing, CN;

Shaoqin Gong, Beijing, CN;

Xinlei Xu, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1092 (2013.01); G06F 11/1666 (2013.01); G06F 2201/805 (2013.01);
Abstract

A concurrent rebuild list indicates RAID extents to be concurrently rebuilt in response to a physical drive failure. When rebuilding of a RAID extent in the list completes, a next RAID extent to add to the list is selected that has a lowest relatedness score in a candidate set of RAID extents. The relatedness score indicates an amount of limitation with regard to concurrently rebuilding the candidate RAID extent in combination with the RAID extents remaining in the concurrent rebuild list. The relatedness score may be a sum of a weighted write score indicating limits on concurrent write operations when rebuilding a candidate RAID extent in combination with the RAID extents remaining in the concurrent rebuild list, and a read score indicating limits on concurrent read operations when rebuilding the candidate RAID extent in combination with the RAID extents remaining in the concurrent rebuild list.


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