The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Apr. 20, 2016
Appdynamics Llc, San Francisco, CA (US);
Arjun Iyer, San Mateo, CA (US);
Yuchen Zhao, Belmont, CA (US);
Cisco Technology, Inc., San Jose, CA (US);
Abstract
A system that utilizes a plurality of time series of metric data to more accurately detect anomalies and model and predict metric values. Streams of time series metric data are processed to generate a set of independent metrics. In some instances, the present system may automatically analyze thousands of real-time streams. Advanced machine learning and statistical techniques are used to automatically find anomalies and outliers from the independent metrics by learning latent and hidden patterns in the metrics. The trends of each metric may also be analyzed and the trends for each characteristic may be learned. The system can automatically detect latent and hidden patterns of metrics including weekly, daily, holiday and other application specific patterns. Anomaly detection is important to maintaining system health and predicted values are important for customers to monitor and make planning and decisions in a principled and quantitative way.