The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Nov. 17, 2014
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Ravish Kumar, Bangalore, IN;

Deepaknath Tandur, Bangalore, IN;

Mallikarjun Kande, Bangalore, IN;

Roland Braun, Lulsdorf, DE;

Bhangale Milind, Jalgaon, IN;

Neil Shah, Ahmedabad, IN;

Stefan Bollmeyer, Minden, DE;

Shashishekhar Pandharkar, Bangalore, IN;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/048 (2006.01); H04L 12/24 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G05B 19/048 (2013.01); H04L 41/0883 (2013.01); H04L 67/125 (2013.01); H04L 67/303 (2013.01); H04L 67/34 (2013.01); G05B 2219/24072 (2013.01);
Abstract

In aspects, the present invention discloses a method for replacing a first field device with a second field device using a commissioning tool. The method comprising retrieving a device description file associated with the first field device, analyzing the device description file, generating a first object by mapping a parameters of the second field device to a parameter from the identified one or more parameters based on a first index and a second index, generating a configuration file associated with the second file device based on the device description file and the generated first object, and transmitting the configuration file to the second field device for commissioning operation of the second field device. The step of analyzing the device description file comprises identifying one or more parameters from the plurality of parameters for mapping based on a predetermined criteria.


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