The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Aug. 23, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Hiroki Takahashi, Saitama, JP;

Mototaka Kanaya, Sano, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 1/118 (2015.01); C03C 3/32 (2006.01); C03C 17/00 (2006.01); G02B 1/113 (2015.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
G02B 1/118 (2013.01); C03C 3/321 (2013.01); C03C 17/007 (2013.01); C03C 17/008 (2013.01); G02B 1/113 (2013.01); H04N 5/33 (2013.01); C03C 2217/445 (2013.01); C03C 2217/732 (2013.01); C03C 2218/119 (2013.01);
Abstract

The invention provides an optical component, an infrared camera including the optical component, and a method for manufacturing the optical component. Antireflection materialsA are formed on a chalcogenide glassof which a compositional ratio of germanium and selenium is 60 percent or greater. With respect to the antireflection materialsA, an extinction coefficient to light of 10.5 μm is 0.01 or less, and a refractive index to light having a wavelength of 10.5 μm are greater than 1 and 2.6 or less. The antireflection materialsA are formed on a surface of a chalcogenide glassat an interval of 0.5 μm to 2.0 μm, so as to form an antireflection film. Adhesiveness of the antireflection filmis higher than that In a case where the surface of the chalcogenide glassis evenly coated with the antireflection materialsA.


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