The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Feb. 07, 2014
Applicant:

Total S.a., Paris, FR;

Inventors:

Anahita Abadpour, Pau, FR;

Pierre Bergey, Saint-Germain-en-Laye, FR;

Assignee:

Total S.A., Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 99/00 (2009.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G01V 2210/61 (2013.01); G01V 2210/66 (2013.01); G01V 2210/663 (2013.01); G01V 2210/665 (2013.01);
Abstract

Disclosed is a method of monitoring the behavior of a subsurface volume. The method comprises transforming a single discrete parameter or an ensemble of discrete parameters describing an attribute of the subsurface volume, each discrete parameter having N possible discrete values with N≥2, into N indicator parameters each having 2 possible discrete values; for each of the two value classes of each indicator parameter, determining the anisotropic distance to a value transition interface; transforming each of the indicator parameters into a corresponding continuous parameter using the determined anisotropic distance to the value transition interface; and using the continuous parameters in a history matching process.


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