The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Nov. 08, 2004
Jurgen Stein, Wuppertal, DE;
Guntram Pausch, Dresden, DE;
Jurgen Stein, Wuppertal, DE;
Guntram Pausch, Dresden, DE;
FLIR Detection, Inc., Stillwater, OK (US);
Abstract
A method of distinguishing effective pulses from test pulses in a scintillation detector that generates measurement light pulses includes providing a regularly-pulsed test light source that produces individual test light pulses having a time-dependent course of relative light intensity, which differs from a time-dependent course of relative light intensity of the measurement light pulses. The test light pulses are provided to a light detector for measurement of the test light pulses. The time-dependent courses of the relative light intensities of the test light pulses are analyzed. The measured pulses are separated into the test light pulses and the measurement light pulses according to the different time-dependent courses of the relative light intensities. The detector includes a scintillator, a light detector, a regularly-pulsed test light source that is adapted provide test light pulses to the light detector for measurement, and an electronic measuring circuit.