The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Apr. 18, 2017
American Science and Engineering, Inc., Billerica, MA (US);
Anatoli Arodzero, Billerica, MA (US);
Joseph Callerame, Lexington, MA (US);
Dan-Cristian Dinca, Chelmsford, MA (US);
Rajen Sud, Burlington, MA (US);
Lee Grodzins, Lexington, MA (US);
Martin Rommel, Lexington, MA (US);
Peter Rothschild, Newton, MA (US);
Jeffrey Schubert, Somerville, MA (US);
Aaron Couture, Reading, MA (US);
Jeffrey M. Denker, Woburn, MA (US);
Jonathan Edward Everett, Lexington, MA (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.