The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Jun. 27, 2016
Fluke Corporation, Everett, WA (US);
David Lawrence Epperson, Everett, WA (US);
Glen Howard Vetter, Stanwood, WA (US);
Joseph V. Ferrante, Redmond, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
In at least one embodiment, a handheld measurement system generates a measurement image derived from measurement data that is generated and/or received by the handheld measurement system. The handheld measurement system also generates a plurality of option images that each correspond to a particular selectable option. A display screen, which may be a touch screen, simultaneously displays the measurement image and the option images. The measurement device modifies the measurement image and/or the option images in response to received option image selections.