The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Nov. 26, 2015
Applicant:
Korea Basic Science Institute, Cheongju-si, Chungcheongbuk-do, KR;
Inventors:
Myoung Choul Choi, Cheongju-si, KR;
Jeong-Hoon Kang, Pohang-si, KR;
Jung-Hwan Kim, Pyeongtaek-si, KR;
Assignee:
Korea Basic Science Institute, Cheongju-si, Chungcheongbuk-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2006.01); H01J 49/16 (2006.01); H01J 49/00 (2006.01); G01N 27/64 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 27/64 (2013.01); H01J 49/0036 (2013.01); H01J 49/161 (2013.01);
Abstract
Provided are an apparatus for measuring an ionic mobility of a harmful material and a reference data obtaining method thereof. The method includes obtaining a measurement signal by detecting a charge of an ion between electrodes, obtaining a noise signal by insulating the electrodes from the ion, aligning the noise signal with the measurement signal, removing a part of the measurement signal aligned with the noise signal, and calculating reference data from a remaining part of the measurement signal.