The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Oct. 27, 2011
Applicants:

Julian C. Burton, Morristown, NJ (US);

Reno F. Debono, Morristown, NJ (US);

Inventors:

Julian C. Burton, Morristown, NJ (US);

Reno F. DeBono, Morristown, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01); G06K 9/00 (2006.01); H01J 49/02 (2006.01); H01J 49/06 (2006.01); G01N 23/00 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 23/00 (2013.01); G06K 9/0053 (2013.01); H01J 49/0031 (2013.01); H01J 49/025 (2013.01); H01J 49/04 (2013.01); H01J 49/06 (2013.01); H01J 49/061 (2013.01);
Abstract

Method and systems for monitoring ion mobility spectrometers are provided. The method can include acquiring scan data, and generating a segment data set from the scan data. The method can further include deriving a subset of peak data from the segment data, where the subset of peak data has an associated set of peak metrics, and deriving a value from the subset of peak data associated with a criteria element of the associated set of peak metrics, where the criteria element has an associated range of values. The method can further include providing an indication in the event the value lies outside the associated range of values.


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