The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2019
Filed:
Jun. 14, 2017
Facebook Technologies, Llc, Menlo Park, CA (US);
Mark Timothy Sullivan, Mountain View, CA (US);
Andrew Matthew Bardagjy, Fremont, CA (US);
Joseph Duggan, San Francisco, CA (US);
Fei Liu, San Jose, CA (US);
Simon Morris Shand Weiss, Redwood City, CA (US);
Facebook Technologies, LLC, Menlo Park, CA (US);
Abstract
An optical characterization system includes a camera assembly and a workstation. The camera assembly is configured to capture images of different portions of a structured light pattern emitted from a device under test in accordance with imaging instructions. In some embodiments, the device under test may be a diffractive optical element (DOE). The workstation provides the imaging instructions to the camera assembly, and stitch the captured images together to form a pattern image. The pattern image is a single image of the entire structured light pattern. The workstation also characterizes performance of the device under test using the pattern image and a performance metric.